AN1227 RF功率MOSFET：改进的射频MOSFET通过包装增强可靠性

AN1227 RF功率MOSFET：改进的射频MOSFET通过包装增强可靠性

AN1227
APPLICATION NOTE
Improved RF MOSFET reliability through
packing enhancements

Abstrct
It is well known that temperature is a critical operating state parameter for today’s electronic
industry. Temperature influences device operating state characteristics and performance. As
well, it is a crucial variable in estimating electronic devices’ lifetime. Most failure mechanisms of
semiconductor devices are accelerated at higher operating temperatures. An antiquated rule of
thumb sug