首页|嵌入式系统|显示技术|模拟IC/电源|元件与制造|其他IC/制程|消费类电子|无线/通信|汽车电子|工业控制|医疗电子|测试测量
首页 > 分享下载 > 测试测量 > LAB_WM-782 - Noise Measurements Using Your LeCroy Oscilloscope

LAB_WM-782 - Noise Measurements Using Your LeCroy Oscilloscope

资料介绍
Random noise arises from every electronic component used in your circuits. The analysis of random electrical noise requires tools which operate in the time, frequency, and statistical domains.
Noise Measurements Using Your LeCroy Oscilloscope Application Brief
Lab WM782



The Tools
Summary Random processes are difficult to characterize because no individual
Random noise arises from measurement provides any information about the previous or next
every electronic component measurement. It is only by looking at cumulative measurements that you
used in your circuits. The can learn about the process you are investigating. Figure 1 shows the
analysis of random electrical basic tools for measuring random processes like noise. The top trace in
LAB_WM-782 - Noise Measurements Using Your LeCroy Oscilloscope
本地下载

评论