首页|嵌入式系统|显示技术|模拟IC/电源|元件与制造|其他IC/制程|消费类电子|无线/通信|汽车电子|工业控制|医疗电子|测试测量
首页 > 分享下载 > 测试测量 > Application Note AN_001 - Glitch Hunting Techniques

Application Note AN_001 - Glitch Hunting Techniques

资料介绍
Intermittent transient events and glitches are among the most frustrating problems to solve. This is especially true if you have no idea about the nature of the transient. LeCroy oscilloscopes include tools to help capture and locate these pesky transients. This paper will focus on techniques for glitch hunting.
LeCroy Application Note Glitch Hunting
Intermittent transient events and glitches are among the most frustrating problems to solve. This is
especially true if you have no idea about the nature of the transient. LeCroy oscilloscopes include tools to
help capture and locate these pesky transients. This paper will focus on techniques for glitch hunting.

Exclusion Triggering
Exclusion triggering can be applied to periodic waveforms such as clock signals. These waveforms have
a nominal shape that does not change with any regularity. Most transients manifest themselves by
abnormal timing. The idea behind exclusion triggering is to measure the signal's nominal timing and to
trigger the scope whenever the signal is outside the nominal r
Application Note AN_001 - Glitch Hunting Techniques
本地下载

评论