DesignCon 2006 - Group Delay and its Impact on Serial Data Transmission and Testing

DesignCon 2006 - Group Delay and its Impact on Serial Data Transmission and Testing
DesignCon 2006




Group Delay and its Impact on
Serial Data Transmission and
Testing


Peter J. Pupalaikis, LeCroy Corporation
PeterP@LeCroy.com
Abstract
This paper is an extension of last years paper entitled “Eye Pattern Measurements in Scopes”.
Last years paper pointed out the effects of bandwidth, roll-off rate, flatness, and group delay
characteristics along with probe loading and return-loss. It only glossed over the more
complicated topic of phase response and group delay. This paper goes into greater detail on this
topic and explains what group delay is, what its impact is, what theoretically correct group delay
is, and how group delay is compensated in both serial data test equipment and serial data
transmitters and receivers.




Author(s) Biography
Pete Pupalaikis is Principal