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TA700 Compliance User Guide

资料介绍
TA700 Compliance User Guide
TA660 Device Compliance Test
User's Guide
TA660 Device Compliance Test
User's Guide

Scope

The scope of this document is to familiarize the user with various sections of the Device Compliance Test
where IUT interaction is required. This document should allow the user to prepare for these tests in
advance.


Description

Compliance Test program includes three test categories which require interaction from IUT. These are
DS_XX (device status test), MP_XX (General Component Protocol checklist of master) and 1.XX
(Component Protocol checklist for a master device) tests. All other tests are performed automatically.

In these tests the TA660 is used as target and the IUT is the master. The TA660 as a target device needs to
have three different addresses for Memory, I/O and
标签:力科PCIPCI-X
TA700 Compliance User Guide
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