Pulsed LIV Testing of Low Power Optical Devices with a Model 2520

DC/AC仪器和系统 / 专业仪器和系统 / 光电子测试
2520型脉冲式激光二极管测试系统（带远端测试头）
Number 2428


Application Note Pulsed LIV Testing of Low Power Optical
Series Devices with an Amplified Integrating
Sphere and the Model 2520
such as transmitters and VCSELs, additional current amplifica-
Introduction tion is required, which can be provided by adding a preamplifier
LIV characterization is an important and commonly used way to between the Model 2520-INT and the photocurrent input of the
verify the performance of