对于ISL5216的IEEE标准测试存取端口和边界扫描寄存器

IEEE Standard Test Access Port and Boundary Scan Register for the ISL5216 (QPDC)
TM
IEEE Standard Test Access Port and Boundary
Scan Register for the ISL5216 (QPDC)
Application Note November 2001 AN9987.1
Russell Davidson & Dejan Radic


Introduction: register. All data is loaded serially in the TDI pin through the
selected test data register, and serially out the TDO pin. Test
The test access port (TAP) provided on the I