MPC5675K Test and Shadow Flash Parameters for ADC Self-Test, MBIST, and LBIST

MPC5675K Test and Shadow Flash Parameters for ADC Self-Test, MBIST, and LBIST
Freescale Semiconductor Document Number: AN4422
Application Note Rev. 0, 02/2012




MPC5675K Test and Shadow Flash
Parameters for ADC Self-Test,
MBIST, and LBIST
by: Curt Hillier
Applications Engineering
Austin, Texas USA


Contents

1 Introduction 1 Introduction................................................................1

The MPC5675K microcontroller offers a set of features to 2 Shadow flash contents―factory
support functional safety applications. Memory, digi