首页|嵌入式系统|显示技术|模拟IC/电源|元件与制造|其他IC/制程|消费类电子|无线/通信|汽车电子|工业控制|医疗电子|测试测量
首页 > 分享下载 > 嵌入式系统 > IEEEStandardTestAccessPortandBoundary-ScanArchitecture

IEEEStandardTestAccessPortandBoundary-ScanArchitecture

资料介绍

详细说明:IEEE Standard Test Access Port and Boundary-Scan Architecture

Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and
support of assembled printed circuit boards is defined. The circuitry includes a standard interface
through which instructions and test data are communicated. A set of test features is defined,
including a boundary-scan register, such that the component is able to respond to a minimum set
of instructions designed to assist with testing of assembled printed circuit boards. Also, a language
is defined that allows rigorous description of the component-specific aspects of such testability
features.

标签:嵌入式ARM
IEEEStandardTestAccessPortandBoundary-ScanArchitecture
本地下载

评论