积分：0分 关键词：IEC，TS 61400-23，Definitions，General Principles，Blade data，Test loading，Load factors，Failure modes，Test procedures and methods
积分：0分 关键词：IEC，61400-22，Symbols and abbreviations，Acceptance of Operating Bodies，Management of the Certification System，Extent of Certification，Type Certification，Project Certification
积分：0分 关键词：IEC，TS 61400-13，Safety during testing，Load Measurement programmes，Measurement Techniques，Processing of measured data
积分：0分 关键词：IEC，61400-12，Test conditions，Test equipment，Measurement procedure，Derived Results
积分：0分 关键词：Sequential Logic Design Practices，Flip-Flops，PLDs，Counters，Shift Registers，Synchronous
积分：0分 关键词：Sequential Logic Design Principles，Bistable Elements，Latches and Flip-Flops，State-Machine，ABEL，VHDL
积分：0分 关键词：Combinational Logic Design Practices，74-Series，Circuit Timing，PLDs，Decoders，Encoders，Multiplexers
积分：0分 关键词：Synthesis，Combinational Logic Design Principles，Switching Algebra，Timing Hazzards，ABEL，VHDL
积分：0分 关键词：Number Systems and Codes，Positional Number Systems，Octal and Hexadecimal Number System Conversions，Negative Numbers，Binary
积分：0分 关键词：Digital Design，Analog versus Digital，Electric Aspects，Software Aspects，Integrated Cirrus，Programmable Logic Devices，Application-Specific ICs，Printed-Circuit Boards，Digital-Design Levels
积分：0分 关键词：CKG7507，显示器，Power，Micro Processor，Vertical Deflection，Horizontal Deflection，High Voltage，Video and Control
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