首页|嵌入式系统|显示技术|模拟IC/电源|元件与制造|其他IC/制程|消费类电子|无线/通信|汽车电子|工业控制|医疗电子|测试测量
首页 > 分享下载 > 嵌入式系统 > 字错率测量方法和表征结果

字错率测量方法和表征结果

资料介绍
Word Error Rate Measurement Methodology and Characterization Results
Application Note 1609


Word Error Rate Measurement Methodology and
Characterization Results
The Word Error Rate (WER) specification of Analog to Measuring an extremely low probability event such as
Digital Converters (A/D) is of particular interest to certain WER can be difficult. As an example, assume a
applications. Typically, these applications are sensitive to 100MSPS, 12-bit A/D with a WER specification of 1E-12.
events during which the A/D digital sample produced Requiring a 100 times oversampling of the error
deviates significantly from the analog input voltage, even cond
标签:intersil字错率
字错率测量方法和表征结果
本地下载

评论