单个事件对ISL705xRH/EH和 ISL706xRH/EH 方根的硬监控电路的测试

Single Event Effects (SEE) Testing of the ISL705xRH/EH and ISL706xRH/EH Rad Hard Supervisory Circuits
Application Note 1651
Authors: Oscar Mansilla, Eric Thomson, Dave Turner and Nick van Vonno


Single Event Effects (SEE) Testing of the ISL705xRH/EH
and ISL706xRH/EH Rad Hard Supervisory Circuits
Introduction SEE Test Objective
The intense heavy ion environment encountered in space The objectives of SEE testing of the ISL705xRH/EH and
applications can cause a variety of transient and destructive ISL706xRH/EH were to evaluate its susceptibility to single
effects in analog circuits, including single-event la