资料介绍
单个事件的影响ISL75051SRH LDO的测试
Application Note 1666
Authors: Theju Bernard, Eric Thomson,
Kevin Knudsen, Nick Vanvonno
Single Event Effects Testing of the ISL75051SRH LDO
SEE Testing: Summary and Part Details
Conclusions Name: ISL75051SRH
Single Event Burnout/Latch-up
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