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多点电容触摸屏的参数化优化设计

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多点电容触摸屏的参数化优化设计www.eetchina.com
多点电容触摸屏的参数化优化设计
彭涛 Principal Circuit and System Design Engineer Cypress Semiconductor Washington Design Center 杨龙 Senior Application Engineer Ansoft Corp. Shanghai 关键词: ITO, 触摸屏,touch screen, Q3D, 电容式触摸技术,capacitive sensing 摘要 电容式触摸屏的三维结构和电路原理决定了其优化设计的唯一途径是多元数值仿真。 本 文介绍了由 Cypress Semiconductor 和 Ansoft 共同研发的参数化 CAD 设计流程。该流 程通过将三维结构参数化,极大的提高了运算效率,使得真正意义上的系统优化成为可 能。 ABSTRACT Circuit principle and technology structure of the capacitive sensing touch panel determines that the multi-variable numerical simulation method is the only solution for design optimization. A parameterized simulation flow, co-developed by Cypress Semiconductor Corp. and Ansoft Corp., is presented in this paper. By parameterizing the 3D structure, this CAD flow significantly improved the design efficiency
多点电容触摸屏的参数化优化设计
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