用于当今高功率器件的高速脉冲测量

用于当今高功率器件的高速脉冲测量
application brief




Achieving Fast Pulse Measurements
for Today’s High Power Devices
Green initiatives and energy efficiency standards worldwide have motivated engineers to find ways to design more efficient
semiconductor devices and integrated circuits, and measuring the true state of these devices without the effects of self-heating
is critical. Test instruments with only DC capability can deliver enough power to a device to cause heat dissipation that alters
its characteristics. Pulsed characterization is a solution to this issue.
The use of a pulsed stimulus demands faster measurements. Traditional precision SMUs (source-measure units) use integrating
ADCs. Although it offer