2440型5A源表

表征平板显示 （Fpd） 中的活动元素是类似于测试其他类型的半导体集成电路设备。然而，到优化的吞吐量和精度的液晶屏、 OLED 和瘦素的应用程序，对参数测试系统、 布线、 重大修改和是必需的方法
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New Test Realities for Evolving FPD Technologies
Charles Cimino and David Rose
Keithley Instruments, Inc.


Characterizing the active elements in flat panel displays (FPDs) is
similar to IC device testing on other types of semiconductors. However, to
optimize throughput and accuracy in LCD, OLED, and LEP applications,
significant modifications to parametric test systems, cabling, and
methodologies are required.