首页|嵌入式系统|显示技术|模拟IC/电源|元件与制造|其他IC/制程|消费类电子|无线/通信|汽车电子|工业控制|医疗电子|测试测量
首页 > 分享下载 > 嵌入式系统 > 墨菲定律和设计“关数据手册”的风险

墨菲定律和设计“关数据手册”的风险

资料介绍
摘要:本应用笔记认为数据表集成电路(ICS)的运作。它讨论的陷阱,谁没有经历过墨菲定律,这是任何可能出错,错误将可能出现的最坏的时间去等待工程师。文章回顾经验和无经验的工程师的思维过程,以及他们如何才能使电路对环境的污染,无线电频率干扰,静电放电泄漏免疫。

Maxim > App Notes > Digital Potentiometers Prototyping and PC-Board Layout

Keywords: inexperienced engineer, leakage, environmental contamination, radio frequency, interference, electro static Sep 28, 2009
discharge, guard bands, sigma, standard deviation specification, automatic test equipment, ATE, second guaranteed
simulation, design temperature

APPLICATION NOTE 4429
Murphy's Law and the Risks of Designing "Off Data Sheet"
By: Bill Laumeister, Strategic Applications Engineer


Abstract: This application note considers off-data-sheet operation of integrated circuits (ICs). It discusses the pitfalls
awaiting engineers who have not experienced Murphy's Law, which is anything that can go wrong, will go wrong at the worst
possible time. The article reviews the thought process of an
墨菲定律和设计“关数据手册”的风险
本地下载

评论