资料介绍
自动特征分析套件(ACS)测试系统应用指南 Number 2847
Application Note ACS Integrated Test System for High
Series Throughput WLR Testing
using an ACS integrated test system and Shared Pad/Pin Test Structure
an SMU (source-measure unit)-per-pin Consider the shared pin device in Figure 3.
configuration. Using Keithley’s Series Four MOSFETs share the gate and bulk pin
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