DesignCon 2009 - Signal Integrity Measurement in High Bit Rate Systems

DesignCon 2009 - Signal Integrity Measurement in High Bit Rate Systems
Signal Integrity Measurement in High Bit
Rate Systems




Michael Schnecker
Martin Miller, PhD
Joseph Schachner
LeCroy Corporation
Agenda
Timing measurements
Basic jitter metrics: TIE and period
Clock measurement example
Measuring jitter and amplitude on serial data signals
Estimating bit error rate performance, bathtub curves and total jitter:
PCIe Gen2 measurement example
Measuring sources of data dependent jitter: DCD, ISI and DDj
Crosstalk effects on jitter
Oscilloscope bandwidth and measurement accuracy
Instrument noise and its impact on measurement
Compensating distortions caused by cable loss and probe response
Methods for char