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首页 > 分享下载 > 嵌入式系统 > Dynamic Testing of High-Speed ADCs, Part 2

Dynamic Testing of High-Speed ADCs, Part 2

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Abstract: Analog-to-digital converters (ADCs) represent the link between analog and digital worlds in receivers, test equipment and other electronic devices. As outlined in Part 1 of this article series, a number of key dynamic parameters provide an accurate correlation of the dynamic performance to be expected from a given ADC. Part 2 of this article series covers some of the setup configurations, equipment recommendations and measurement procedures for testing the dynamic specifications of high-speed ADCs.
Maxim > Design Support > Technical Documents > Tutorials > A/D and D/A Conversion/Sampling Circuits > APP 729
Maxim > Design Support > Technical Documents > Tutorials > Basestations/Wireless Infrastructure > APP 729
Maxim > Design Support > Technical Documents > Tutorials > High-Speed Signal Processing > APP 729
Keywords: analog to digital converters, ADCs, high-speed ADC, SNR, SINAD, ENOB, THD, SFDR, two-tone IMD, multi-tone IMD,
clock jitter, FFT, spectrum, window functions, spectral leakage, frequency bin, bins, coherent sampling, hanning, hamming, flat top
Jul 22, 2002
TUTORIAL 729

Dynamic Testing of High-Speed ADCs, Part 2
Jul 22, 2002

Abstract: Analog-to-digital……
标签:MaximanalogtodigitalconvertersADCshigh-speedADCSNRSINADENOBTHDSFDRtwo-toneIMDmulti-toneIMDclockjitterFFTspectrumwindowfunctionsspectralleakagefrequencybinbinscoherentsamplinghanninghammingflattop
Dynamic Testing of High-Speed ADCs, Part 2
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