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首页 > 分享下载 > 嵌入式系统 > Defining and Testing Dynamic Parameters in High-Speed ADCs, Part 1

Defining and Testing Dynamic Parameters in High-Speed ADCs, Part 1

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Abstract: The first part of this article series discusses commonly known definitions most crucial for high-speed data converters (in this case analog-to-digital converter or short ADCs) used in communications, instrumentation and data acquisition applications. The purpose of this article is to help the reader gain a better understanding of common parameters such as signal-to-noise ratio (SNR), signal-to-noise-and-distortion (SINAD), total harmonic distortion (THD) and spurious-free dynamic range (SFDR). In the second part of this article series (see "Dynamic Testing of High-Speed ADCs" for further reading), these parameter definitions are put to the test by measuring them in real-world test scenarios.
Maxim > Design Support > Technical Documents > Tutorials > A/D and D/A Conversion/Sampling Circuits > APP 728
Maxim > Design Support > Technical Documents > Tutorials > Basestations/Wireless Infrastructure > APP 728
Maxim > Design Support > Technical Documents > Tutorials > High-Speed Signal Processing > APP 728
Keywords: ADCs, analog to digital, analog digital, converter, high-speed ADC, high-speed analog to digital converters, SNR, SINAD,
THD, SFDR, two-tone IMD, multi-tone IMD, VSWR, noise, harmonics, DFT, FFT, spectral leakage
Nov 19, 2001
TUTORIAL 728

Defining and Testing Dynamic Parameters in High-Speed
ADCs, Part 1
Nov 19, 2001

Abstract: The first part of this a……
标签:MaximADCsanalogtodigitalanalogdigitalconverterhigh-speedADChigh-speedanalogtodigitalconvertersSNRSINADTHDSFDRtwo-toneIMDmulti-toneIMDVSWRnoiseharmonicsDFTFFTspectralleakage
Defining and Testing Dynamic Parameters in High-Speed ADCs, Part 1
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