Bench Characterization of ADCs Using a Low-Cost PC-Based Data-Acquisition Board

Abstract: This application note describes techniques of using a PC based Digital I/O Board to characterize analog-to-digital converters (ADCs). It will look at static DC parameters such as integral nonlinearity (INL), differential nonlinearity (DNL), gain, and offset errors, but also noise, internal reference voltage, and channel-to-channel coupling and matching, as well as the supply voltage dependence.
Maxim > App Notes > A/D and D/A CONVERSION/SAMPLING CIRCUITS

Keywords: ADC, characterization, INL, DNL, gain, offset, channel coupling and matching, National Intruments, Aug 01, 2001
NI, Labview, PC, DAQ, analog to digital converters

APPLICATION NOTE 633
Bench Characterization of ADCs Using a Low-Cost PC-Based Data-
Acquisition Board

Abstract: This application note describes techniques of using a PC based Digital I/O Board to characterize
analog-to-digital converters (ADCs). It will look at static DC parameters such as integral nonlinearity (INL),
differential nonlinearity (DNL), gain, and offset errors, but also noise, internal reference voltage, and channel-
to-channel coupling and matching, as well as the supply voltage dependence.


With the increasing complexity of analog-to-digi