单个事件的影响ISL70218SRH测试、双36 V方根硬低功率运作功率放大器

Single Event Effects Testing of the ISL70218SRH, Dual 36V Rad Hard Low Power Operation Amplifiers
Application Note 1677
Authors: Oscar Mansilla, Richard Hood, Lawrence Pearce, Eric Thomson and Nick Vanvonno


Single Event Effects Testing of the ISL70218SRH, Dual
36V Rad Hard Low Power Operation Amplifiers
Introduction SEE Test Objective
The intense heavy ion environment encountered in space The objectives of SEE testing on the ISL70218SRH were to
applications can cause a variety of transient and destructive evaluate its susceptibility to single event latch-up and