ESD Protection for High Speed IO Data Lines

高速IO接口的ESD保护
APN001
ESD Protection for High Speed I/O Data Lines
Abstract
These days, our modern society has rapidly come to fully depend on electronics. And modern
computers are based increasingly on low power logic chips, all with ESD sensitivity due to MOS
dielectric breakdowns and bipolar reverse junction current limits. The ICs that control I/O ports
(USB, Ethernet, etc.) are not an exception since the majority of them are designed and
manufactured based on CMOS processes which make them extremely sensitive to damage from
ESD conditions. Because the majority of I/O ports are hot insertion and removal systems, they
are extremely vulnerable to receive ESD conditions possibly generated by the users or