资料介绍
EOS与ESDEOS/ESD Testing Today
EOS or ESD ?
ESD - Electro-Static Discharge
“Equalization of different electrostatic potentials
between two or more objects”
EOS - Electrical Over-Stress
“An electrical event that is outside the specified
range of the device under test” (Latch-up)
2
EOS or ESD !
Both will damage devices by a rapid localized heating of
the semiconductor material or by rapidly creating strong
electrical fields
Critically, even very small discharges or over-stress can
be fatal or cause latent failures
3
Dominant ESD Test Methods
(HBM) Human Body Model
(MM) Machine Model
(CDM) Charged Device Model
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