首页|嵌入式系统|显示技术|模拟IC/电源|元件与制造|其他IC/制程|消费类电子|无线/通信|汽车电子|工业控制|医疗电子|测试测量
首页 > 分享下载 > 模拟IC/电源 > An Evaluation of MOS Interface-Trap Charge Pump

An Evaluation of MOS Interface-Trap Charge Pump

资料介绍
An Evaluation of MOS Interface-Trap Charge Pump
as an Ultralow Constant-Current Generator
IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 38, NO. 1, JANUARY 2003 71




An Evaluation of MOS Interface-Trap Charge Pump
as an Ultralow Constant-Current Generator
Ugur ilingiroglu, Adriana Becker-Gómez, and Kenton T. Veeder, Member, IEEE


Abstract―In this work, we explore the MOS interface-trap nanoamp current source and 2) there exists no integrable and
charge-pump as an ultralow constant-current generator for analog stable resistive element with which this level of reference cur-
CMOS applications. Charge pumping techniques in general are rent can be generated. An alternative is the switched-capacitor
more suitable than conventional continuous-time techniques f
标签:AnEvaluationMOSInterface
An Evaluation of MOS Interface-Trap Charge Pump
本地下载

评论