资料介绍
An Evaluation of MOS Interface-Trap Charge Pump
as an Ultralow Constant-Current GeneratorIEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 38, NO. 1, JANUARY 2003 71
An Evaluation of MOS Interface-Trap Charge Pump
as an Ultralow Constant-Current Generator
Ugur ilingiroglu, Adriana Becker-Gómez, and Kenton T. Veeder, Member, IEEE
Abstract―In this work, we explore the MOS interface-trap nanoamp current source and 2) there exists no integrable and
charge-pump as an ultralow constant-current generator for analog stable resistive element with which this level of reference cur-
CMOS applications. Charge pumping techniques in general are rent can be generated. An alternative is the switched-capacitor
more suitable than conventional continuous-time techniques f