04.Electrical Overstress

04.Electrical Overstress
Electrical Overstress
EOS
 Electrical Over-Stress
Electrical Over-Stress (EOS)
Electrical Over-Stress (EOS) is a term/acronym used to describe the thermal
damage that may occur when an electronic device is subjected to a current or
voltage that is beyond the specification limits of the device.


EOS Damage
The thermal damage is the result of the excessive heat generated during the EOS
event.
The heat is a result of resistive heating in the connections within the device. The
high currents experienced during the EOS event can generate very localized high
temperatures even in the normally low resistance paths. The high temperature
causes destructive damage to the materials used in the device’s construction.




Cypress Semiconductor Co