资料介绍
《并行测试技术》 www.keithley.com
1st
Edition
Parallel Test Technology
The New Paradigm for Parametric Testing
Parallel Test Technology:
The New Paradigm for
Parametric Testing
1st Edition
A G R E A T E R M E A S U R E O F C O N F I D E N C E
Foreword
As the dimensions of modern integrated circuits continue to shrink and the use
of innovative materials grows, device fabrication and parametric testing have become
more challenging with each passing year. Every device shrink, every process innova-
tion, and every new material has made the repeatability and volume of data produced
by parametric test more critical to process development and controlling modern
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