《半导体元器件测试指南》

《半导体元器件测试指南》
Series 2600
System SourceMeter
Instruments
Semiconductor Device Test
Applications Guide




Contains Programming Examples



A G R E A T E R M E A S U R E O F C O N F I D E N C E
 Table of Contents

Section 1 General Information 3.3 Common-Emitter Characteristics . . . . . . . . . . 3-1
3.3.1 Test Configuration . . . . . . . . . . . . . . . 3-2
1.1 Introduction . . . . . . . . . . . . . . . . . . . . . 1-1