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IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices

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    As printed circuit boards (PCBs) become more complex, the need for thorough testing becomes increasingly important. Advances in surface-mount packaging and PCB manufacturing have resulted in smaller boards, making traditional test methods (e.g., external test probes and “bed-of-nails” test fixtures) harder to implement. As a result, cost savings from PCB space reductions are sometimes offset by cost increases in traditional testing methods.
标签:JTAGMAX2CPLDBoundary-Scan
IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices
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