Device Structures and Material...

Device Structures and Materials for Scaling to Si Limits and BeyondDevice Structures and Materials for Scaling to Si Limits and Beyond
Krishna Saraswat Materials Structures and Devices MARCO Focus Research Center

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Focus Research Center Program: Time Scale

Essential complement to ongoing, nearterm efforts Focus where evolutionary R&D may not find solutions
Technology scaling
0.13m
2002

90nm
2004

65nm
2006

45nm
2008

30-20nm
2010

10nm?
2012+

current near-term R&D...

MARCO FRCP Agenda

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The Four Current Focus Centers
Design and Test Focus Center
Director: Jan Rabaey, Berkeley
Component-based design, constructive fabrics, fully programmable systems, test, verification, energy & power, calibrating achievable designs

Lead School: U.C. Berkeley
CMU MIT Penn State Princeton Purdue Stanford UCLA UC