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Frequency limitation in the calibration of microwave2000
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 51, NO. 9, SEPTEMBER 2003
Frequency Limitation in the Calibration of Microwave Test Fixtures
Ning Hua Zhu, Member, IEEE, Chen Qian, You Lin Wang, Edwin Y. B. Pun, Senior Member, IEEE, and Po-Shuen Chung, Senior Member, IEEE
Abstract―The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. For asymmetric test fixtures, a new algorithm based on the thru
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