资料介绍
一种去嵌入射频测量技术一种去嵌入射频测量技术
黄成 吴建辉 陆生礼 时龙兴 （东南大学电子工程系，南京，210096） 摘要：去嵌入是一种射频微波精确测量技术。本文介绍了一种新型的去嵌入测量技术。该方法只需要一个 对称的直通微带结构就能完成去嵌入。最后利用该方法对 0603 封装的电感进行了测量，并提取了精确测量 后的电感模型。结果表明本去嵌入方法可以应用于射频 PCB 上器件模型的精确测量和模型提取。 关键词：夹具测量 中图分类号:TP353 去嵌入 双端口网络 S 参数
A De-embedding RF Measurement Technique
Huang Cheng, Ye Rong-Fang (Southeast University, Electronic Engineering Department, NanJing, 210096) Abstract：De-embedding was one of the precision RF and microwave measurements. The objective of this research was to present a novel de-embedding technique. This method was unique in that one single symmetric THRU de-embedding structure was required. A 0603 inductor was measured and the extrinsic model of this device was extracted using this method . The results indicate this new technique is useful in RF PCB devices measureme
我要上传