首页|嵌入式系统|显示技术|模拟IC/电源|元件与制造|其他IC/制程|消费类电子|无线/通信|汽车电子|工业控制|医疗电子|测试测量
首页 > 分享下载 > 消费类电子 > 电感失效分析

电感失效分析

资料介绍
电感
RELIABILITY TEST CONDITIONS
WIRE WOUND CHIP INDUCTORS TYPE
FOR SMD322522/453232 / SMTSDR322520/453226 / SMDCHGR0603/0805/1008/1210 /
SMDFSR1008 / SMTS | |
|Item (項目) |Required |Test Method/Condition (測試 |
| |Characteristics |方法) |
| |(要求) | |
|High temperature |1.No case deformation|Temperature: 85±2℃ Time : |
|Storage test |or |96±2 hours |
| |change in appearance.|Tested not less than 1 hour,|
|Reference |2.ΔL/L≦10% |nor more than 2 hours at |
|documents: |3.ΔQ/Q≦30% |room temperature. |
|MIL-STD-202G Method|4.ΔDCR/DCR≦10% |[pic]
标签:电感
电感失效分析
本地下载

评论