资料介绍
电感
RELIABILITY TEST CONDITIONS
WIRE WOUND CHIP INDUCTORS TYPE
FOR SMD322522/453232 / SMTSDR322520/453226 / SMDCHGR0603/0805/1008/1210 /
SMDFSR1008 / SMTS | |
|Item (項目) |Required |Test Method/Condition (測試 |
| |Characteristics |方法) |
| |(要求) | |
|High temperature |1.No case deformation|Temperature: 85±2℃ Time : |
|Storage test |or |96±2 hours |
| |change in appearance.|Tested not less than 1 hour,|
|Reference |2.ΔL/L≦10% |nor more than 2 hours at |
|documents: |3.ΔQ/Q≦30% |room temperature. |
|MIL-STD-202G Method|4.ΔDCR/DCR≦10% |[pic]